Oxford Instruments (LON:OXIG) issued its quarterly earnings data on Tuesday. The company reported GBX 56.30 ($0.75) earnings per share (EPS) for the quarter, beating the Thomson Reuters’ consensus estimate of GBX 54.20 ($0.72) by GBX 2.10 ($0.03), Bloomberg Earnings reports. Oxford Instruments had a return on equity of 13.16% and a net margin of 7.57%.
Shares of Oxford Instruments traded up GBX 48 ($0.64), reaching GBX 1,064 ($14.17), on Thursday, Marketbeat Ratings reports. 140,879 shares of the company were exchanged, compared to its average volume of 49,802. Oxford Instruments has a one year low of GBX 680 ($9.05) and a one year high of GBX 1,174 ($15.63).
The business also recently disclosed a dividend, which will be paid on Friday, October 19th. Stockholders of record on Thursday, September 13th will be paid a dividend of GBX 9.60 ($0.13) per share. The ex-dividend date of this dividend is Thursday, September 13th. This represents a dividend yield of 0.96%. This is a boost from Oxford Instruments’s previous dividend of $3.70.
In related news, insider Gavin Hill acquired 235 shares of the company’s stock in a transaction dated Friday, April 6th. The shares were bought at an average price of GBX 763 ($10.16) per share, for a total transaction of £1,793.05 ($2,387.23). In the last quarter, insiders have bought 268 shares of company stock worth $209,717.
Oxford Instruments Company Profile
Oxford Instruments plc, through its subsidiaries, researches, develops, manufactures, rents, sells, and services tools and systems in the United States, rest of Europe, rest of Asia, the United Kingdom, Japan, China, Germany, and internationally. The company's Nanotechnology Tools segment provides high performance scientific imaging cameras, spectroscopy solutions, and microscopy systems for research and OEM markets; atomic force probe microscopy for materials and bioscience applications; 3D and 4D image visualization and analysis software; and nanoanalysis solutions for materials characterization and nanofabrication on scanning electron microscopes, focussed ion beams, and transmission electron microscopes.
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